• DocumentCode
    333475
  • Title

    Finite element analysis of temperature profiles in linear phased multi-electrode ablation

  • Author

    Sun, Weimin

  • Author_Institution
    Therapy Res., Guidant Corp., St. Paul, MN, USA
  • fYear
    1998
  • fDate
    29 Oct-1 Nov 1998
  • Firstpage
    252
  • Abstract
    Several finite element models have been used for simulating radio-frequency (RF) ablation of a one-tip electrode system. For atrial fibrillation (AF) ablation, a multi-electrode catheter is often used in order to create a uniform linear lesion. In this paper, a multi-electrode finite element model is used to analyze temperature profiles and lesion depths during phased linear AF ablation. Temperature profiles, lesion depth and lesion uniformity are found to be significantly influenced by various ablation parameters such as power delivery phase angle, blood flow rate, tissue and blood conductivity. The effects of these parameters on lesion size can be analyzed and compared in simulated power-controlled or temperature-controlled ablation procedures
  • Keywords
    bioelectric phenomena; biomedical electrodes; biothermics; cardiology; finite element analysis; patient treatment; physiological models; temperature distribution; atrial fibrillation; blood conductivity; blood flow rate; lesion depth; lesion size; lesion uniformity; linear phased multi-electrode ablation; multielectrode finite element model; one-tip electrode system; parameters effects; power delivery phase angle; temperature profiles; therapeutic technique; tissue conductivity; Atrial fibrillation; Blood flow; Catheters; Conductivity; Electrodes; Finite element methods; Lesions; Power system modeling; Radio frequency; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 1998. Proceedings of the 20th Annual International Conference of the IEEE
  • Conference_Location
    Hong Kong
  • ISSN
    1094-687X
  • Print_ISBN
    0-7803-5164-9
  • Type

    conf

  • DOI
    10.1109/IEMBS.1998.745888
  • Filename
    745888