DocumentCode
3334871
Title
Correlating Geometry and Shielding Effects on Accelerated Soft Errors in 90nm SRAM Using Spallation Neutron Beams
Author
Zhu, Xiaowei ; Baumann, Rob ; Takala, Bruce ; Dohmann, Dwayne ; Martinez, Larry
Author_Institution
Texas Instrum., Dallas, TX
fYear
2006
fDate
38899
Firstpage
191
Lastpage
194
Abstract
Accelerated soft error data in embedded SRAM in an advanced CMOS DSP are used to determine the impact of geometry and shielding effects on the accuracy of extrapolated product failure rates due to terrestrial neutrons
Keywords
CMOS digital integrated circuits; SRAM chips; digital signal processing chips; neutron effects; radiation hardening (electronics); shielding; 90 nm; accelerated soft errors; advanced CMOS DSP; correlating geometry; embedded SRAM; product failure rates; shielding effects; spallation neutron beams; terrestrial neutrons; Acceleration; Building materials; CMOS technology; Digital signal processing chips; Geometry; Instruments; Monitoring; Neutrons; Particle beams; Random access memory; Beam; Neutron; Radiation; Shielding;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop, 2006 IEEE
Conference_Location
Ponte Vedra, FL
Print_ISBN
1-4244-0638-2
Type
conf
DOI
10.1109/REDW.2006.295492
Filename
4077306
Link To Document