DocumentCode :
3335058
Title :
Principles of statistical physics as applied to EMC
Author :
Kohlberg, I. ; Hemmady, S.
Author_Institution :
Kohlberg Assoc., Inc., Reston, VA, USA
fYear :
2010
fDate :
20-24 Sept. 2010
Firstpage :
685
Lastpage :
688
Abstract :
This paper examines the applications of statistical physics-stochastic processes, ergodic principles, the use of nonlinear dynamic state equations and chaos, and the Wiener-Khintchine theorem to better explain how Intentional ElectroMagnetic Interference (IEMI) disrupts the performance of feedback and hybrid electronic systems such as control systems, power electronics and SCADAs. The origin of spurious “almost-random” voltage fluctuations induced within a complicated enclosure when exposed to EM fluences is explained, and a mathematical formulation to quantify the energy coupled into a complicated cavity under High Power Microwave stress is derived.
Keywords :
chaos; electromagnetic compatibility; electromagnetic interference; statistical mechanics; stochastic processes; EMC; Wiener-Khintchine theorem; chaos; ergodic principles; high power microwave stress; intentional electromagnetic interference; nonlinear dynamic state equations; statistical physics; stochastic process; Chaos; Couplings; Electromagnetics; Equations; Impedance; Mathematical model; Transmission line matrix methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetics in Advanced Applications (ICEAA), 2010 International Conference on
Conference_Location :
Sydney, NSW
Print_ISBN :
978-1-4244-7366-3
Type :
conf
DOI :
10.1109/ICEAA.2010.5651557
Filename :
5651557
Link To Document :
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