An algebraic approach to test generation for sequential circuits

Author

Lioy, A. ; Macii, E. ; Meo, A.R. ; Reorda, M. Sonza

Author_Institution

Politecnico di Torino, Italy

fYear

1991

fDate

1-2 Mar 1991

Firstpage

115

Lastpage

120

Abstract

The authors describe an algebraic algorithm for automatic test pattern generation for sequential circuits. Three innovative concepts have been introduced in order to reduce the computational time required for pattern generation. These are: firstly, circuit partitioning in fanout-free regions; then, computation of observability and excitability functions for state propagation and justification; and finally, assignment of an observability and an excitability order to each node of the decision tree, for fast test pattern detection of each fault

Keywords

Boolean functions; automatic testing; logic testing; observability; sequential circuits; trees (mathematics); algebraic algorithm; automatic test pattern generation; circuit partitioning; computational time; decision tree; excitability functions; fanout-free regions; logic circuits; observability; sequential circuits; state propagation; Automatic test pattern generation; Circuit faults; Circuit testing; Decision trees; Electrical fault detection; Fault detection; Observability; Partitioning algorithms; Sequential analysis; Sequential circuits;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI, 1991. Proceedings., First Great Lakes Symposium on

Conference_Location

Kalamazoo, MI

Print_ISBN

0-8186-2170-2

Type

conf

DOI

10.1109/GLSV.1991.143952

Filename

143952