DocumentCode
3335152
Title
The digital silicon photomultiplier — Principle of operation and intrinsic detector performance
Author
Frach, Thomas ; Prescher, Gordian ; Degenhardt, Carsten ; De Gruyter, Rik ; Schmitz, Anja ; Ballizany, Rob
Author_Institution
Philips Digital Photon Counting, Aachen, Germany
fYear
2009
fDate
Oct. 24 2009-Nov. 1 2009
Firstpage
1959
Lastpage
1965
Abstract
We developed a fully digital implementation of the Silicon Photomultiplier. The sensor is based on a single photon avalanche photodiode (SPAD) integrated in a standard CMOS process. Photons are detected directly by sensing the voltage at the SPAD anode using a dedicated cell electronics block next to each diode. This block also contains active quenching and recharge circuits as well as a one bit memory for the selective inhibit of detector cells. A balanced trigger network is used to propagate the trigger signal from all cells to the integrated time-to-digital converter (TDC). Photons are detected and counted as digital signals, thus making the sensor less susceptible to temperature variations and electronic noise. The integration with CMOS logic has the added benefit of low power consumption and possible integration of data post-processing. In this paper, we discuss the sensor architecture and present first measurements of the technology demonstrator test chip.
Keywords
CMOS integrated circuits; analogue-digital conversion; avalanche photodiodes; low-power electronics; nuclear electronics; photomultipliers; silicon radiation detectors; CMOS logic; SPAD anode; active quenching circuits; balanced trigger network; dedicated cell electronics block; digital silicon photomultiplier; low power consumption; recharge circuits; single photon avalanche photodiode; standard CMOS process; time-to-digital converter; Anodes; Avalanche photodiodes; CMOS process; Detectors; Diodes; Optoelectronic and photonic sensors; Photomultipliers; Silicon; Temperature sensors; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
Conference_Location
Orlando, FL
ISSN
1095-7863
Print_ISBN
978-1-4244-3961-4
Electronic_ISBN
1095-7863
Type
conf
DOI
10.1109/NSSMIC.2009.5402143
Filename
5402143
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