• DocumentCode
    3335667
  • Title

    Coverage-Based Testing on Embedded Systems

  • Author

    Wu, X. ; Li, J. Jenny ; Weiss, D. ; Lee, Y.

  • Author_Institution
    Arizona State Univ., Tempe
  • fYear
    2007
  • fDate
    20-26 May 2007
  • Firstpage
    7
  • Lastpage
    7
  • Abstract
    One major issue of code coverage testing is the overhead imposed by program instrumentation, which inserts probes into the program to monitor its execution. In real-time systems, the overhead may alter the program execution behavior or impact its performance due to its strict requirement on timing. Coverage testing is even harder on embedded systems because of their critical and limited memory and CPU resources. This paper describes a case study of a coverage-based testing method for embedded system software focusing on minimizing instrumentation overhead. We ported a code coverage-based test tool to an in-house embedded system, IP phone. In our initial experiments, we found that this tool didn ´t affect the behavior of the program under test.
  • Keywords
    embedded systems; program testing; code coverage testing; coverage-based testing; embedded systems; program execution behavior; program under test; real-time systems; Embedded software; Embedded system; Instruments; Monitoring; Probes; Real time systems; Software systems; Software testing; System testing; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Automation of Software Test , 2007. AST '07. Second International Workshop on
  • Conference_Location
    Minneapolis, MN
  • Print_ISBN
    978-0-7695-2971-2
  • Type

    conf

  • DOI
    10.1109/AST.2007.8
  • Filename
    4296718