DocumentCode
3336044
Title
Non-uniform long-wavelength quantum well infrared photodetectors with low dark current and high BLIP temperature
Author
Wang, S.Y. ; Lee, C.P.
Author_Institution
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
fYear
1999
fDate
23-23 June 1999
Firstpage
78
Lastpage
79
Abstract
Quantum well infrared photodetectors (QWIPs) based on III-V compound semiconductors have been extensively studied in recent years. The flexibility of the quantum well design and the maturity of the III-V material technology make QWIPs very attractive for long wavelength detection. However, because of the photoconductive type detection, the dark current of QWIPs is usually high and the therefore the background limited operation temperature (BLIP) is normally below 77 K. This put a severe constraint on the cooling system for QWIPs. Recently, it is reported that the electric field distribution inside a QWIP is not uniform and this phenomenon causes nonlinearity characteristics. Using this property, we have designed and fabricated a QWlP with a non-uniform quantum well structure to alter the electric field. The resulting dark current is much lower and the detectivity is much higher than those of conventional QWIPs.
Keywords
III-V semiconductors; infrared detectors; photoconducting devices; photodetectors; quantum well devices; 77 K; III-V compound semiconductor; background limited operation temperature; dark current; electric field distribution; nonlinearity; nonuniform long-wavelength quantum well infrared photodetector; photoconductive detection; Cooling; Dark current; Doping; Gain measurement; Noise measurement; Nonuniform electric fields; Photoconductivity; Photodetectors; Temperature; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference Digest, 1999 57th Annual
Conference_Location
Santa Barbara, CA, USA
Print_ISBN
0-7803-5170-3
Type
conf
DOI
10.1109/DRC.1999.806330
Filename
806330
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