• DocumentCode
    333620
  • Title

    Temperature measurements by thermal radiation during ArF excimer laser ablation with gelatin gel

  • Author

    Ishihara, Miya ; Arai, Tsunenori ; Kikuchi, Makoto ; Nakano, Hironori ; Obara, Minoru

  • Author_Institution
    Dept. of Med. Eng., Nat. Defense Med. Coll., Saitama, Japan
  • Volume
    4
  • fYear
    1998
  • fDate
    29 Oct-1 Nov 1998
  • Firstpage
    1873
  • Abstract
    We measured temperature elevation during photorefractive keratectomy (PRK) by thermal radiation. The thermal radiation from ablating surface of gelatin gel (15%wt) by ArF excimer laser was detected by a MCT detector with 1 μs rise time. The measured signal increased sharply just after the laser pulse and decreased quasi-exponentially. We calculated the temperature elevation using Stefan-Boltzmann radiation law. The maximum temperature elevation was 97°C at 208 mJ/cm2 in laser fluence. The temperature elevation over 60°C was kept for 85 μs. These temperature elevation might induce possible heat damage on ablated surface. Our high temporal resolution temperature monitoring may be available to achieve safety and precise PRK
  • Keywords
    biomedical measurement; biothermics; eye; gelatin; laser ablation; laser applications in medicine; patient monitoring; photorefractive effect; surgery; temperature measurement; ArF; MCT detector; Stefan-Boltzmann radiation law; ablation depth; collagen concentration; cornea; excimer laser ablation; gelatin gel; heat damage; high temporal resolution; maximum temperature elevation; photorefractive keratectomy; spectral response; temperature measurements; temperature monitoring; thermal radiation; Cornea; Laser ablation; Optical pulses; Optical surface waves; Photorefractive effect; Pulsed laser deposition; Radiation detectors; Temperature distribution; Temperature measurement; Wavelength measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 1998. Proceedings of the 20th Annual International Conference of the IEEE
  • Conference_Location
    Hong Kong
  • ISSN
    1094-687X
  • Print_ISBN
    0-7803-5164-9
  • Type

    conf

  • DOI
    10.1109/IEMBS.1998.746960
  • Filename
    746960