• DocumentCode
    3336282
  • Title

    A 60 nm channel length silicon stacked tunnel transistor

  • Author

    Nakazato, Kazuo ; Itoh, K. ; Mizuta, H. ; Ahmed, H.

  • Author_Institution
    Cavendish Lab., Cambridge Univ., UK
  • fYear
    1999
  • fDate
    23-23 June 1999
  • Firstpage
    132
  • Lastpage
    133
  • Abstract
    The transistor is a vertical, fully depleted double-gate SOI-MOSFET (silicon-on-insulator metal-oxide-semiconductor-field-effect-transistor) with barriers in the channel region. Gate voltage modulates the internal potential in the intrinsic silicon region and the central shutter barrier or barriers (CSB) also move up and down energetically following the internal potential. The CSB reduce the OFF current substantially, while keeping a high ON current in the device. The role of source and drain barriers is, (1) to adjust the source impedance to the CSB, (2) to act as diffusion barriers keeping a low impurity level within the channel, and (3) to reduce leakage current such as GIDL (gate induced drain leakage) current at the drain side.
  • Keywords
    MOSFET; elemental semiconductors; silicon; silicon-on-insulator; tunnel transistors; 60 nm; Si; central shutter barrier; diffusion barrier; gate induced drain leakage current; internal potential; silicon stacked tunnel transistor; source impedance; vertical fully-depleted double-gate SOI-MOSFET; Capacitors; Coupling circuits; Current measurement; Electrons; Equivalent circuits; Silicon; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference Digest, 1999 57th Annual
  • Conference_Location
    Santa Barbara, CA, USA
  • Print_ISBN
    0-7803-5170-3
  • Type

    conf

  • DOI
    10.1109/DRC.1999.806346
  • Filename
    806346