DocumentCode
3336282
Title
A 60 nm channel length silicon stacked tunnel transistor
Author
Nakazato, Kazuo ; Itoh, K. ; Mizuta, H. ; Ahmed, H.
Author_Institution
Cavendish Lab., Cambridge Univ., UK
fYear
1999
fDate
23-23 June 1999
Firstpage
132
Lastpage
133
Abstract
The transistor is a vertical, fully depleted double-gate SOI-MOSFET (silicon-on-insulator metal-oxide-semiconductor-field-effect-transistor) with barriers in the channel region. Gate voltage modulates the internal potential in the intrinsic silicon region and the central shutter barrier or barriers (CSB) also move up and down energetically following the internal potential. The CSB reduce the OFF current substantially, while keeping a high ON current in the device. The role of source and drain barriers is, (1) to adjust the source impedance to the CSB, (2) to act as diffusion barriers keeping a low impurity level within the channel, and (3) to reduce leakage current such as GIDL (gate induced drain leakage) current at the drain side.
Keywords
MOSFET; elemental semiconductors; silicon; silicon-on-insulator; tunnel transistors; 60 nm; Si; central shutter barrier; diffusion barrier; gate induced drain leakage current; internal potential; silicon stacked tunnel transistor; source impedance; vertical fully-depleted double-gate SOI-MOSFET; Capacitors; Coupling circuits; Current measurement; Electrons; Equivalent circuits; Silicon; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference Digest, 1999 57th Annual
Conference_Location
Santa Barbara, CA, USA
Print_ISBN
0-7803-5170-3
Type
conf
DOI
10.1109/DRC.1999.806346
Filename
806346
Link To Document