• DocumentCode
    3336697
  • Title

    Time resolved measurement of a pulsed X-ray source with the Timepix detector

  • Author

    Böhnel, Michael ; Sievers, Peter ; Roth, Jürgen ; Buchholz, Gerd ; Hupe, Oliver ; Ankerhold, Ulrike ; Michel, Thilo ; Anton, Gisela

  • Author_Institution
    ECAP - Novel Detectors/Med. Phys., Univ. of Erlangen, Erlangen, Germany
  • fYear
    2009
  • fDate
    Oct. 24 2009-Nov. 1 2009
  • Firstpage
    1682
  • Lastpage
    1684
  • Abstract
    The hybrid pixelated semiconductor Timepix detector is the successor of the Medipix2 X-ray detector. It is provided with additional functions directly integrated in the pixel electronics which allows to perform the measurement of event times of interacting X-ray photons in the silicon sensor layer in respect of the end of each acquisition. Due to the number of pixels of the device there are 65536 independently working channels available to determine the time structure of high flux X-ray sources which are operating in a pulsed mode. These X-ray sources are commonly used in medical applications and homeland security and create X-ray bursts in the range of 50 ns. We present the results of the time resolved measurement of a pulsed X-ray field and the corresponding measurement which was done in a collaboration with the Physikalisch Technische Bundesanstalt (PTB).
  • Keywords
    X-ray detection; semiconductor counters; Medipix2 X-ray detector; PTB; X-ray bursts; X-ray photons; homeland security; hybrid pixelated semiconductor Timepix detector; medical applications; pixel electronics; pulsed X-ray source; silicon sensor layer; time resolved measurement; Biomedical equipment; Medical services; Optoelectronic and photonic sensors; Performance evaluation; Pulse measurements; Silicon; Terrorism; Time measurement; X-ray detection; X-ray detectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-3961-4
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2009.5402234
  • Filename
    5402234