DocumentCode
333769
Title
Time-frequency analysis of event-related brain potentials
Author
Bianchi, A.M. ; Leocani, L. ; Mainardi, L.T. ; Comi, G. ; Cerutti, S.
Author_Institution
Lab. of Biomed. Eng., S. Raffaele Hosp., Milano, Italy
Volume
3
fYear
1998
fDate
29 Oct-1 Nov 1998
Firstpage
1486
Abstract
The event related potentials recorded before, during and after the voluntary movement of a finger, contain relevant information regarding the nervous mechanism involved at central level. As the phenomena of interest take place in short time, the frequency information was obtained from the signal by means of a recursive implementation of a bivariate autoregressive (AR) model. The spectral and cross-spectral parameters have been calculated in correspondence of each sample in the signal and for each recording electrode in the 10-20 system. The time course of the power in different frequency bands was obtained together with coherence and phase relationships. The algorithm allowed the evaluation of the time instant in which the events of interest take place, evidencing the beginning and the end of event related desynchronization and event related synchronization giving a global insight into the observed phenomena
Keywords
autoregressive processes; bioelectric potentials; electroencephalography; medical signal processing; spectral analysis; time-frequency analysis; EEG; bivariate autoregressive model; coherence relationships; cross-spectral parameters; event related desynchronization; event related synchronization; event-related brain potentials; multivariate analysis; nervous mechanism; phase relationships; recursive implementation; spectral parameters; time-frequency analysis; voluntary finger movement; Biomedical engineering; Brain modeling; Electrodes; Electroencephalography; Frequency synchronization; Hospitals; Predictive models; Rhythm; Signal analysis; Time frequency analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 1998. Proceedings of the 20th Annual International Conference of the IEEE
Conference_Location
Hong Kong
ISSN
1094-687X
Print_ISBN
0-7803-5164-9
Type
conf
DOI
10.1109/IEMBS.1998.747167
Filename
747167
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