DocumentCode
333808
Title
Neural network based approaches for the classification of colonoscopic images
Author
Krishnan, S.M. ; Yap, C.J. ; Asari, K.V. ; Goh, P.M.Y.
Author_Institution
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore
Volume
3
fYear
1998
fDate
29 Oct-1 Nov 1998
Firstpage
1678
Abstract
A new method of colon status classification based on a set of quantitative parameters extracted from colonoscopic images is proposed. This can assist endoscopists for the early detection of abnormalities in the colon. Images captured by colonoscopic procedure are subjected to subsequent processing and analysis for the extraction of quantitative parameters, which form the input vectors to the three different neural networks selected for classification of colon. The three networks, viz. a two-layer perceptron trained with delta rule, a multilayer perceptron with backpropagation learning and a self-organising network, are used and the results obtained by the proposed methods are satisfactory. A comparative study of the three methods is also performed and it is observed that the self-organising network is more appropriate for the classification of colon status
Keywords
backpropagation; biological organs; feature extraction; feedforward neural nets; image classification; image segmentation; medical image processing; multilayer perceptrons; self-organising feature maps; tumours; backpropagation learning; colon status classification; colonoscopic images; early detection of abnormalities; endoscopy; feature extraction; feedforward architecture; image classification; image segmentation; input vectors; multilayer perceptron; neural network based approaches; quantitative parameters; self-organising network; trained with delta rule; two-layer perceptron; Artificial neural networks; Backpropagation; Colon; Electronic mail; Histograms; Image analysis; Multilayer perceptrons; Neural networks; Surgery; Tumors;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 1998. Proceedings of the 20th Annual International Conference of the IEEE
Conference_Location
Hong Kong
ISSN
1094-687X
Print_ISBN
0-7803-5164-9
Type
conf
DOI
10.1109/IEMBS.1998.747232
Filename
747232
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