• DocumentCode
    3339481
  • Title

    First alignment of the complete CMS silicon tracker

  • Author

    Kaschube, Kolja

  • Author_Institution
    Inst. for Exp. Phys., Univ. of Hamburg, Hamburg, Germany
  • fYear
    2009
  • fDate
    Oct. 24 2009-Nov. 1 2009
  • Firstpage
    1189
  • Lastpage
    1193
  • Abstract
    We present the first results of the full CMS Silicon Tracker alignment based on several million reconstructed tracks from the cosmic data taken during commissioning runs with the detector in its final position. The all-silicon design of the CMS Tracker poses new challenges in aligning a complex system with 15148 silicon strip and 1440 silicon pixel modules. For optimal track-parameter resolution, the position and orientation of its modules need to be determined with a precision of several micrometers. For the modules well illuminated by cosmic ray particles, the ultimate precision has been achieved with data from the silicon modules traversed in-situ by charged muons used in combination with survey measurements. The achieved resolution in all five track parameters is controlled with data-driven validation of the track parameter measurements near the interaction region, and tested against prediction with a detailed detector simulation.
  • Keywords
    particle tracks; position sensitive particle detectors; silicon radiation detectors; CMS silicon tracker alignment; charged muons; compact muon solenoid silicon tracker alignment; complex system; cosmic data; cosmic ray particles; data-driven validation; detector simulation; optimal track-parameter resolution; silicon pixel modules; silicon strip module; survey measurements; track parameter measurements; Collision mitigation; Detectors; Large Hadron Collider; Laser beams; Mesons; Particle measurements; Particle tracking; Silicon; Size measurement; Strips; Alignment; CMS; cosmic muons; silicon pixels; silicon strips; track detector;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record (NSS/MIC), 2009 IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-3961-4
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2009.5402386
  • Filename
    5402386