• DocumentCode
    3339876
  • Title

    Thermal noise from switches in a switched-capacitor gain stage

  • Author

    Acharya, Arup ; Hurst, Paul J. ; Lewis, Stephen H.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., California Univ., Davis, CA, USA
  • fYear
    2003
  • fDate
    23-25 Feb. 2003
  • Firstpage
    121
  • Lastpage
    126
  • Abstract
    Thermal noise in switched-capacitor (SC) gain stages limits the minimum signal amplitude that can be processed. This paper presents expressions for the input-referred noise due to thermal noise of MOS switches used in gain stages, based on a single-stage opamp model. Comparisons with simple expressions and SPICE simulations are presented. The new expressions are in closer agreement with the simulation results than the simple expressions.
  • Keywords
    SPICE; circuit simulation; data conversion; integrated circuit noise; switched capacitor networks; thermal noise; SPICE simulations; input-referred noise; signal amplitude; single-stage opamp model; switched-capacitor gain stage; thermal noise; 1f noise; Circuit noise; Gaussian noise; MOSFETs; Noise level; Signal to noise ratio; Switches; Switching circuits; Thermal resistance; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Mixed-Signal Design, 2003. Southwest Symposium on
  • Print_ISBN
    0-7803-7778-8
  • Type

    conf

  • DOI
    10.1109/SSMSD.2003.1190410
  • Filename
    1190410
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3339876