DocumentCode
3339948
Title
Reliable matching of building facades using geometric measurements and an iterative reliability verification model
Author
Yow, Kin Choong ; Thet, Lin Aung
Author_Institution
Singapore Sch. of Comput. Eng., Nanyang Technol. Univ., Singapore, Singapore
fYear
2010
fDate
26-29 Sept. 2010
Firstpage
933
Lastpage
936
Abstract
This paper presents an approach for reliable matching of feature points in images of building facades with wide viewpoint changes. These images of man-made facades can render state-of-the-art techniques such as SIFT ineffective due to low texture and inclusion of repetitive items. The proposed approach integrates both appearance-based measurements and geometric measurements to find correct feature matches. The reliabilities of feature matches are reinforced with a belief network based on the assumption that if a match is a true match, it should have similarity in geometry with the other matches. The geometric measurements used here are the distances and angles between the imaginary lines connecting the pairs of matches. The most reliable match which we call the reference match is selected based on the achievement of maximum votes from other matches. The number of correct matches is expanded by selecting the matches which have similar geometry with respect to the reference match. A homography model is then applied to eliminate the wrongly selected matches. Extensive experimental results demonstrate higher reliability of our approach than state-of-the-art techniques such as SIFT, and SIFT in combination with RANSAC.
Keywords
belief networks; geometry; image matching; reliability; SIFT; appearance based measurements; belief network; building facades; geometric measurements; homography model; iterative reliability verification model; reliable matching; Buildings; Correlation; Databases; Navigation; Probabilistic logic; Reliability engineering;
fLanguage
English
Publisher
ieee
Conference_Titel
Image Processing (ICIP), 2010 17th IEEE International Conference on
Conference_Location
Hong Kong
ISSN
1522-4880
Print_ISBN
978-1-4244-7992-4
Electronic_ISBN
1522-4880
Type
conf
DOI
10.1109/ICIP.2010.5651843
Filename
5651843
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