• DocumentCode
    3340978
  • Title

    Effects of load cycles on AC extruded cable reliability: Is a reduced pre-qualification test always the right choice?

  • Author

    Mazzanti, G. ; Marzinotto, M.

  • Author_Institution
    Electr. Eng. Dept., Univ. of Bologna, Bologna, Italy
  • fYear
    2013
  • fDate
    June 30 2013-July 4 2013
  • Firstpage
    648
  • Lastpage
    651
  • Abstract
    In this paper, a new method is proposed for the estimation of time to failure percentiles and life fraction lost in the so-called “Extension of pre-Qualification (EQ) test” according to CIGRE TBs 303. The method accounts for the time-varying temperature during the EQ load cycles via an approach that relies on: 1) Miner´s law of cumulated aging; 2) an improved voltage-time characteristic that includes the electro-thermal stress; 3) a probabilistic framework based on the Weibull hypothesis. On these grounds, an alternative to the EQ test is proposed, referred to as “Improved Extension of Qualification (IEQ) test”, based on a more strict correlation between cable insulation reliability in design stress conditions and that during the test itself, thereby taking into account the electro-thermal endurance features of a given extruded cable design.
  • Keywords
    power cable insulation; power cable testing; probability; reliability; AC extruded cable reliability; CIGRE TBs 303; EQ load cycle effect; IEQ test; Miner law; Weibull hypothesis; cable insulation reliability; cumulated aging; design stress conditions; electro-thermal endurance features; electro-thermal stress; extension of pre-qualification test; extruded cable design; improved extension of qualification test; improved voltage-time characteristic; life fraction lost; probabilistic framework; reduced pre-qualification test; time to failure percentile estimation; time-varying temperature; Aging; Cable insulation; Conductors; IEC standards; Power cables; Stress; Thermal stresses; electro-thermal stress; extension of prequalification; extruded cables; qualification tests;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid Dielectrics (ICSD), 2013 IEEE International Conference on
  • Conference_Location
    Bologna
  • ISSN
    2159-1687
  • Print_ISBN
    978-1-4799-0807-3
  • Type

    conf

  • DOI
    10.1109/ICSD.2013.6619723
  • Filename
    6619723