DocumentCode :
3341139
Title :
Influence of chemical annealing on electronic properties of a-(Si, Ge)
Author :
Zhao Li ; Dalal, Vikram L.
Author_Institution :
Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA
fYear :
2013
fDate :
16-21 June 2013
Abstract :
Hydrogenated amorphous Silicon-Germanium alloy [a-(Si, Ge):H]remains an important material with applications for solar cells and detectors. In this paper, we show that the properties of the materials and devices can be significantly improved by using chemical annealing, or layer-by-layer growth, where one grows a thin layer followed by controlled hydrogen ion bombardment, and then repeats the process. The properties measured include H bonding, photo-conductivity, electron and hole mobility-lifetime products and p-i-n solar cell device properties. We also measured the stability of solar cells subjected to light soaking and find significant improvements in stability for chemically annealed devices compared to devices produced using normal, continuous growth. The improvement in stability and electronic properties is ascribed to an improved hydrogen microstructure produced in the material due to chemical annealing as indicated by an examination of the infrared absorption in the films.
Keywords :
Ge-Si alloys; amorphous semiconductors; annealing; crystal microstructure; electron mobility; hole mobility; hydrogen; hydrogen bonds; infrared spectra; photoconductivity; semiconductor thin films; solar cells; Si-Ge:H; chemical annealing; detectors; electron mobility; electronic properties; hole mobility-lifetime; hydrogen bonding; hydrogen ion bombardment; hydrogen microstructure; hydrogenated amorphous silicon-germanium alloy; infrared absorption; layer-by-layer growth; p-i-n solar cell; photoconductivity; thin films; Annealing; Bonding; Chemicals; Films; Microstructure; Photovoltaic cells; amorphous materials; photovoltaic cells; silicon-germanium alloy; stability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th
Conference_Location :
Tampa, FL
Type :
conf
DOI :
10.1109/PVSC.2013.6744210
Filename :
6744210
Link To Document :
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