• DocumentCode
    3341898
  • Title

    [Breaker page]

  • fYear
    2008
  • fDate
    16-20 March 2008
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Breaker page.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Thermal Measurement and Management Symposium, 2008. Semi-Therm 2008. Twenty-fourth Annual IEEE
  • Conference_Location
    San Jose, CA
  • ISSN
    1065-2221
  • Print_ISBN
    978-1-4244-2123-7
  • Type

    conf

  • DOI
    10.1109/STHERM.2008.4509391
  • Filename
    4509391