• DocumentCode
    3343350
  • Title

    Study of fault diagnosis approach based on rules of deep knowledge representation of signed directed graph

  • Author

    Cao, Wen-liang ; Wang, Bing-shu ; Ma, Liang-Yu ; Yan, Qin ; Hao, Wei ; Xin, Yufeng

  • Author_Institution
    Sch. of Control Sci. & Eng., North China Electr. Power Univ., Baoding
  • fYear
    2005
  • fDate
    14-17 Dec. 2005
  • Firstpage
    778
  • Lastpage
    782
  • Abstract
    The fault diagnosis method using a signed directed graph (SDG) based on qualitative model as a model of the system is useful to real-time diagnosis of failures that occur in process. First, it establishes the SDG of the systems and components, simplifies these SDG corresponding to the fault modes needing to be diagnosed, at the same time SDG are described the many rules forms for shortening the calculating time of making use of SDG, then expands the diagnosing rule with expert knowledge to construct the diagnosing rule bank of the system. Second, the fault modes can be primary diagnosed by using the constructed rules. And then the modes that can not be distinguished are diagnosed by adding adequate quantitative information. The case studies show that the problem of misoperation autodiagnosis during computer simulation training can be solved effectively, and the SDG diagnosis method has good completeness, fine resolution and detailed explanation in actual industrial process
  • Keywords
    diagnostic expert systems; directed graphs; fault diagnosis; knowledge representation; adequate quantitative information; constructed rules; deep knowledge representation; diagnosing rule bank; expert knowledge; fault diagnosis approach; qualitative model; signed directed graph; Computer industry; Computer simulation; Fault diagnosis; Industrial relations; Industrial training; Knowledge representation; Power engineering and energy; Power generation; Power system modeling; Real time systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Technology, 2005. ICIT 2005. IEEE International Conference on
  • Conference_Location
    Hong Kong
  • Print_ISBN
    0-7803-9484-4
  • Type

    conf

  • DOI
    10.1109/ICIT.2005.1600741
  • Filename
    1600741