Electron-beam diagnostics for Jefferson Lab´s high power free electron laser

Author

Krafft, G.A. ; Jordan, K. ; Kehne, D. ; Benson, S. ; Denard, J. ; Feldl, E. ; Piot, P. ; Song, J. ; Ursic, R.

Author_Institution

Thomas Jefferson Nat. Accel. Facility, Newport News, VA, USA

Volume

1

fYear

1997

fDate

12-16 May 1997

Firstpage

912

Abstract

In this paper the current plans for the diagnostic complement for Jefferson Lab´s IRFEL are presented. Diagnostic devices include optical transition radiation beam viewers, both stripline and button beam position monitors, multislit beam emittance measuring devices, coherent synchrotron and transition radiation bunch length monitoring devices, and synchrotron light cameras for measuring the beam profile at high average power. Most devices have update rates of order 1 sec or shorter, and all are controlled through an EPICS control system

Keywords

electron accelerators; free electron lasers; linear accelerators; particle beam diagnostics; synchrotron radiation; transition radiation; EPICS control system; IRFEL; Jefferson Lab; beam profile; bunch length monitoring; button beam position monitor; coherent synchrotron; electron-beam diagnostics; high power free electron laser; multislit beam emittance measurement; optical transition radiation beam viewers; stripline beam position monitor; synchrotron light cameras; transition radiation; Control systems; Length measurement; Optical beams; Optical devices; Position measurement; Power measurement; Radiation monitoring; Stimulated emission; Stripline; Synchrotron radiation;

fLanguage

English

Publisher

ieee

Conference_Titel

Particle Accelerator Conference, 1997. Proceedings of the 1997

Conference_Location

Vancouver, BC

Print_ISBN

0-7803-4376-X

Type

conf

DOI

10.1109/PAC.1997.749879

Filename

749879