DocumentCode
3344197
Title
Aging and pollution studies of EPDM polymers by means of a time-resolved current method in a SEM
Author
Bouguedad, D. ; Mekhaldi, A. ; Jbara, O. ; Rondot, S. ; Hadjadj, A.
Author_Institution
Dept. d´Electrotech., Univ. Mouloud Mammeri, Tizi-Ouzou, Algeria
fYear
2013
fDate
June 30 2013-July 4 2013
Firstpage
623
Lastpage
627
Abstract
In this article, we deal with the charge phenomena of surface-polluted Ethylene Propylene Diene Monomer (EPDM) used in medium-voltage cables. Conductive sodium chloride solutions of varying conductivity were deposited on the surface of both as-received and thermally aged polymers in order to simulate the influence of salt air on cables. These samples were charged under electron irradiation in a scanning electron microscope (SEM). By means of a time-resolved current method implemented in the SEM, we have dynamically studied the degradation of the dielectric properties of EPDM, i.e. how the charging behavior of the polymer changes with the conductivity of the polluted surface. This method allows measurement of both the leakage current of electrons that flow on the specimen surface to the ground and the trapped charge to be measured. The obtained results show that leakage current clearly increases with surface conductivity and that the trapped charge at the steady state decreases as the conductivity increases.
Keywords
ageing; cables (electric); leakage currents; polymers; scanning electron microscopes; EPDM polymers; SEM; aging studies; conductive sodium chloride solutions; electrons leakage current; medium-voltage cables; pollution studies; scanning electron microscope; surface conductivity; surface-polluted ethylene propylene diene monomer; time-resolved current method; varying conductivity; Aging; Conductivity; Current measurement; Electron traps; Leakage currents; Pollution; Radiation effects; EPDM; displacement current; leakage current; surface conductivity; trapped charge;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid Dielectrics (ICSD), 2013 IEEE International Conference on
Conference_Location
Bologna
ISSN
2159-1687
Print_ISBN
978-1-4799-0807-3
Type
conf
DOI
10.1109/ICSD.2013.6619884
Filename
6619884
Link To Document