DocumentCode
3344448
Title
Electroporation as a mechanism of the saturation of transmembrane potential induced by large electric fields
Author
DeBruin, Katherine A. ; Krassowska, W.
Author_Institution
Dept. of Biomed. Eng., Duke Univ., Durham, NC, USA
Volume
5
fYear
1996
fDate
31 Oct-3 Nov 1996
Firstpage
1836
Abstract
Experimental studies have shown that the magnitude of a shock-induced transmembrane potential increases only slightly with any increase in the strength of the electric field above approximately 7 V/cm. In this study, computer simulations of both passive and active fibers are used to test the hypothesis that this saturation of transmembrane potential is due to electroporation. A passive fiber model with an electroporating membrane reproduced the experimental data with a root mean square error (rmse) of 7.63% and a correlation coefficient (ccf) of 0.9980. An active model with Luo-Rudy kinetics and an electroporating membrane yielded results with a rmse of 22.5% and a ccf of 0.9983. Both simulations were in good qualitative and quantitative agreement with the experimental data, supporting the idea that the development of current-carrying pores is an important factor in the saturation of transmembrane potential during exposure to large electric fields
Keywords
bioelectric potentials; biological effects of fields; biomembranes; digital simulation; electric field effects; physiological models; Luo-Rudy kinetics; active fibers; active model; computer simulations; current-carrying pores; electric field strength; electroporating membrane; electroporation; passive fibers; root mean square error; shock-induced transmembrane potential; transmembrane potential saturation mechanism; Biomedical engineering; Biomembranes; Computer simulation; Conductivity; Defibrillation; Electric shock; Kinetic theory; Muscles; Optical fiber testing; Root mean square;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 1996. Bridging Disciplines for Biomedicine. Proceedings of the 18th Annual International Conference of the IEEE
Conference_Location
Amsterdam
Print_ISBN
0-7803-3811-1
Type
conf
DOI
10.1109/IEMBS.1996.646279
Filename
646279
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