DocumentCode :
3344757
Title :
Smooth GaN recess wet photoelectrochemical etching
Author :
Gregusova, D. ; Novák, J. ; Hardtdegen, H. ; Soltys, J. ; Kostic, I. ; Gregus, J. ; Kordos, P.
fYear :
2004
fDate :
Oct. 17-21, 2004
Firstpage :
199
Lastpage :
202
Keywords :
Contacts; Electrons; Gallium nitride; Oxidation; Photoconductivity; Rough surfaces; Surface roughness; Temperature; Topology; Wet etching;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Semiconductor Devices and Microsystems, 2004. ASDAM 2004. The Fifth International Conference on
Print_ISBN :
0-7803-8335-7
Type :
conf
DOI :
10.1109/ASDAM.2004.1441194
Filename :
1441194
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3344757