Title :
TEM cell mode excitation as a function of DUT harness wire number
Author :
Slattery, Kevin ; Neal, Jeffrey
Author_Institution :
Ricardo North American, Madison, AL, USA
Abstract :
This paper describes a series of measurements that show TEM cell resonances as a function of the number of wires populating a DUT harness. Due to DUT interaction with the TEM cell over certain frequency ranges, an uncertainty had been introduced into the test data: was the DUT susceptible, or was the DUT interacting with the test fixture? This led to a question concerning whether the DUT harness was properly decoupled at the point of entry to the TEM cell. A series of measurements were made with varying lengths of wire and varying wire count in order to determine what factors led to field enhancement in the test region
Keywords :
electric field measurement; magnetic field measurement; test facilities; wires (electric); DUT harness decoupling; DUT harness wire number; TEM cell mode excitation; TEM cell resonances; field enhancement; test region; uncertainty; wire count; Connectors; Filters; Fixtures; Frequency measurement; Length measurement; Probes; Resonance; TEM cells; Testing; Wire;
Conference_Titel :
Electromagnetic Compatibility, 1998. 1998 IEEE International Symposium on
Conference_Location :
Denver, CO
Print_ISBN :
0-7803-5015-4
DOI :
10.1109/ISEMC.1998.750100