Long term reliability of mass-produced high-efficiency silicon point-contact solar cells under 250× concentration

Author

Slade, Alexander ; Gordon, Robert ; Dutra, David ; Garboushian, Vahan

Author_Institution

Amonix Inc., Torrance, CA, USA

fYear

2002

fDate

19-24 May 2002

Firstpage

1015

Lastpage

1018

Abstract

The paper will present efficiency results of high concentration silicon solar cells that were measured before and after 30 months of exposure to ∼ 25 W/cm² sunlight. It is concluded that a process developed by Amonix Inc. provides UV stability to point-contact silicon solar cells under ∼ 25 W/cm² for prolonged periods. Efficiency results are presented for individual solar cells and for modules made up of 24 series-connected solar cells. In particular, the modules are generally over 22.5% efficient at PVUSA conditions, if the optical losses of the lens are excluded.

Keywords

elemental semiconductors; semiconductor device measurement; semiconductor device reliability; silicon; solar cells; ultraviolet radiation effects; 22.5 percent; 30 month; Si; UV stability; efficiency; high concentration silicon solar cells; long term reliability; silicon point-contact solar cells; sunlight exposure; Costs; Degradation; Foundries; Manufacturing processes; Optical surface waves; Photovoltaic cells; Production; Semiconductor device manufacture; Silicon; State feedback;

fLanguage

English

Publisher

ieee

Conference_Titel

Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE

ISSN

1060-8371

Print_ISBN

0-7803-7471-1

Type

conf

DOI

10.1109/PVSC.2002.1190777

Filename

1190777