• DocumentCode
    3345650
  • Title

    A comparative study of bulk InGaAs and InGaAs/InGaAs strain-compensated quantum well cells for thermophotovoltaic applications

  • Author

    Abbott, P. ; Rohr, C. ; Connolly, J.P. ; Ballard, I. ; Bamham, K.W.J. ; Ginige, R. ; Corbett, B. ; Clarke, G. ; Bland, S.W. ; Mazzer, M.

  • Author_Institution
    Blackett Lab., Imperial Coll. of Sci., UK
  • fYear
    2002
  • fDate
    19-24 May 2002
  • Firstpage
    1058
  • Lastpage
    1061
  • Abstract
    One of the main requirements for thermophotovoltaic (TPV) systems powered by fuel combustion is a low level of pollution. To achieve this, low combustion temperatures are needed. The most efficient narrow band emitters emit at long wavelengths, necessitating low band gap cells. Erbium oxide emits around 1500 nm and we report an InGaAs p-n cell which is well matched to this spectrum. Two more suitable emitters are thulium oxide and holmium oxide, which emit around 1700nm and 1950nm respectively, beyond the band gap of lattice matched InGaAs. To absorb this emission, lattice mismatched materials must be used. The technique of strain compensation can prevent the creation of dislocations within the structure. We present results of a strain-compensated InGaAs/InGaAs Quantum Well Cell (QWC) which demonstrates the success of this structure in allowing wavelength response to be extended whilst displaying a lower dark current.
  • Keywords
    III-V semiconductors; gallium arsenide; indium compounds; quantum well devices; thermophotovoltaic cells; 1500 nm; 1700 nm; 1950 nm; InGaAs; InGaAs-InGaAs; InGaAs/InGaAs quantum well; bulk InGaAs; fuel combustion; lattice mismatch; pollution level; strain compensation; thermophotovoltaic cell; Capacitive sensors; Combustion; Erbium; Fuels; Indium gallium arsenide; Lattices; Narrowband; Photonic band gap; Temperature; Thermal pollution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE
  • ISSN
    1060-8371
  • Print_ISBN
    0-7803-7471-1
  • Type

    conf

  • DOI
    10.1109/PVSC.2002.1190788
  • Filename
    1190788