Title :
Multi-Physics Based Structural Similarity Rules for the BGA Package Family
Author :
van Driel, W.D. ; Mavinkurve, A. ; van Gils, M.A.J. ; Zhang, G.Q. ; Yang, D.G. ; Ernst, L.J.
fDate :
May 31 2005-June 3 2005
Keywords :
Costs; Fabrication; Integrated circuit packaging; Integrated circuit reliability; Lead; Physics; Process design; Qualifications; Semiconductor device packaging; Testing;
Conference_Titel :
Electronic Components and Technology Conference, 2005. Proceedings. 55th
Conference_Location :
Lake Buena Vista, FL
Print_ISBN :
0-7803-8907-7
DOI :
10.1109/ECTC.2005.1441262