DocumentCode
3345929
Title
Fabrication of graphene devices for infrared detection
Author
Lai, King Wai Chiu ; Fung, Carmen Kar Man ; Chen, Hongzhi ; Yang, Ruiguo ; Ong, Bo Song ; Xi, Ning
Author_Institution
Electr. & Comput. Eng. Dept., Michigan State Univ., East Lansing, MI, USA
fYear
2010
fDate
12-15 Oct. 2010
Firstpage
14
Lastpage
17
Abstract
Researchers have been looking for novel materials to improve the performance of photonic devices. Graphene has great potential to optoelectronic applications because of its excellent optical properties. Here, we demonstrate using the graphene-based photodetectors for infrared detection under a zero-bias operation. We have demonstrated to use an electric-field-assisted method to manipulate graphene flake between metal microelectrodes successfully without the electron beam lithography. The devices are made from few-layer-graphene and multi-layer-graphene which are confirmed by Raman spectroscopy and atomic force microscopy. The size of the graphene flake can be as large as 15 μm × 15 μm. The obtained results demonstrate high potential applications of the electric-field-assisted technique and nano assembly to fabricate graphene-based infrared photodetectors.
Keywords
Raman spectroscopy; atomic force microscopy; graphene; infrared detectors; microelectrodes; optoelectronic devices; photodetectors; C; Raman spectroscopy; atomic force microscopy; electric-field-assisted method; few-layer-graphene; graphene device fabrication; graphene flake; graphene-based photodetector; infrared detection; metal microelectrode; multilayer-graphene; optoelectronic application; photonic device; zero-bias operation; Force; Metals; Microelectrodes; Microscopy; Nanoscale devices; Photoconductivity;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology Materials and Devices Conference (NMDC), 2010 IEEE
Conference_Location
Monterey, CA
Print_ISBN
978-1-4244-8896-4
Type
conf
DOI
10.1109/NMDC.2010.5652175
Filename
5652175
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