Title :
Evaluating building integrated photovoltaic performance models
Author :
Davis, Mark W. ; Fanney, A. Hunter ; Dougherty, Brian P.
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Abstract :
Predictive performance tools could accelerate the implementation of building integrated photovoltaics (BIPV). The National Institute of Standards and Technology (NIST) seeks to improve and validate previously developed computer simulation tools with experimental data collected in a building integrated photovoltaic "test bed." Twelve months of performance data has been collected for BIPV panels using four different cell technologies: crystalline, polycrystalline, silicon film, and triple-junction amorphous. Two panels using each cell technology were present, one without any insulation attached to its rear surface and one with insulation attached to its rear surface. Two predictive performance tools were investigated: IV Curve Tracer, a photovoltaic model developed by Sandia National Laboratories (SNL), and PHANTASM, a BIPV predictive tool developed by the Solar Energy Laboratory at the University of Wisconsin. The performance data associated with the eight panels in the BIPV "test bed", along with meteorological data, was compared to the predictions of the SNL and PHANTASM models.
Keywords :
amorphous semiconductors; building integrated photovoltaics; digital simulation; elemental semiconductors; power engineering computing; semiconductor thin films; silicon; solar cells; BIPV; BIPV panels; IV Curve Tracer; National Institute of Standards and Technology; PHANTASM; Sandia National Laboratories; Solar Energy Laboratory; University of Wisconsin; building integrated photovoltaic performance models; computer simulation tools; crystalline solar cells; performance data; photovoltaic model; polycrystalline solar cells; predictive performance tools; silicon film solar cells; triple-junction amorphous solar cells; Acceleration; Building integrated photovoltaics; Computer simulation; Crystallization; Insulation; Laboratories; NIST; Predictive models; Silicon on insulator technology; Testing;
Conference_Titel :
Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE
Print_ISBN :
0-7803-7471-1
DOI :
10.1109/PVSC.2002.1190931