• DocumentCode
    3348176
  • Title

    Pb-free Assembly, Rework, and Reliability Analysis of IPC Class 2 Assemblies

  • Author

    Gleason, Jerry ; Reynolds, Charlie ; Bath, Jasbir ; Chu, Quyen ; Kelly, Matthew ; Lyjak, Ken ; Roubaud, Patrick

  • Author_Institution
    HP, Palo Alto, CA
  • fYear
    2005
  • fDate
    May 31 2005-June 3 2005
  • Firstpage
    959
  • Lastpage
    969
  • Abstract
    A team of NEMI companies collaborated for three years to develop Pb-free assembly and rework processes for double-sided, 14-layer, printed circuit boards (PCB) in two thicknesses (0.093" and 0.135") with electrolytic NiAu and immersion Ag surface finishes. This work followed the initial SMT manufacturing feasibility effort carried out by the first NEMI Pb-free development team (1999-2002). All SMT assembly, PTH wave assembly and component rework processes were carried out on production equipment. Various test vehicles including the reliability test board were used in a multiphase development project to develop Pb-free assembly and rework parameters and temperature profiles prior to a 100-board process technology verification build. Following the double-sided SMT and wave assembly build, half of the printed circuits assemblies were passed through a series of representative component rework protocols. Each build group was then subjected to a series of mechanical and thermal reliability stress tests, including 5700 cycles of 0 to 100degC, followed by failure analysis. A special test board was designed utilizing a high temperature laminate designed for Pb-free soldering. Approximately 30% of the assemblies were SnPb control samples. This paper will present the Pb-free SMT assembly and rework development process using the NEMI Sn3.9Ag0.6Cu solder, and results of the reliability stress tests. The rework of large, thick PCB\´s with Pb-free solder poses a significant challenge to the industry. The lesson\´s learned and recommendations for future work will be discussed
  • Keywords
    assembling; copper alloys; failure analysis; nickel alloys; printed circuit manufacture; printed circuit testing; silver alloys; solders; stress analysis; surface mount technology; tin alloys; 0 to 100 C; Ag; IPC class 2 assemblies; NiAu; PTH wave assembly; Pb-free assembly; SMT assembly; Sn3.9Ag0.6Cu; component rework processes; component rework protocols; double-sided printed circuit boards; electrolytic surface finishes; failure analysis; immersion surface finishes; mechanical reliability; printed circuits assemblies; production equipment; reliability analysis; reliability test board; stress tests; surface mount technology; temperature profiles; thermal reliability; Assembly; Circuit testing; Collaborative work; Manufacturing; Printed circuits; Production equipment; Surface finishing; Surface-mount technology; Temperature; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2005. Proceedings. 55th
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-8907-7
  • Type

    conf

  • DOI
    10.1109/ECTC.2005.1441388
  • Filename
    1441388