• DocumentCode
    334857
  • Title

    Diode and final-focus simulations for DARHT

  • Author

    Hughes, Thomas P. ; Welch, Dale R. ; Carson, R.L.

  • Author_Institution
    Mission Res. Corp., Albuquerque, NM, USA
  • Volume
    2
  • fYear
    1997
  • fDate
    12-16 May 1997
  • Firstpage
    1867
  • Abstract
    Beam dynamics calculations for the injector and final-focus region of a 4 kA, 20 MeV linear induction accelerator are presented. The injector is a low-emittance 4 MeV thermionic or photocathode diode designed to produce four 70 ns pulses over 2 μsec. Due to the long total pulse length, we have kept the field stress to <200 kV/cm over the cathode electrode, and to ≈50 kV/cm on the radial insulator stacks. The normalized edge emittance produced by the diode is only≈0.019 cm-rad. In the final-focus region, we have modelled the effect of ion emission from the target. The intense electric field of the beam at the 1-mm-diameter focal spot produces substantial ion velocities, and, if the space-charge-limited current density can be supplied, significant focal spot degradation may occur due to ion space charge. Calculations for the existing Integrated Test Stand, which has a larger focal spot, show that the effect should be observable for H+ and C+ ion species. The effect is lessened if there is insufficient ion density on the target to supply the space-charge-limited current density, or if the ion charge-to-mass ratio is sufficiently small
  • Keywords
    collective accelerators; electron accelerators; electron beam focusing; linear accelerators; particle beam dynamics; particle beam injection; photodiodes; test facilities; thermionic cathodes; 20 MeV; 4 kA; C; DARHT; H; Integrated Test Stand; beam dynamics calculations; final-focus simulations; focal spot degradation; injector; intense electric field; linear induction accelerator; low-emittance thermionic diode; normalized edge emittance; photocathode diode; radial insulator stacks; space-charge-limited current density; Cathodes; Current density; Degradation; Diodes; Electrodes; Insulation; Ion emission; Linear accelerators; Particle beams; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Particle Accelerator Conference, 1997. Proceedings of the 1997
  • Conference_Location
    Vancouver, BC
  • Print_ISBN
    0-7803-4376-X
  • Type

    conf

  • DOI
    10.1109/PAC.1997.751043
  • Filename
    751043