• DocumentCode
    3352067
  • Title

    A functionally graded piezoelectric material created by an internal temperature gradient

  • Author

    Yamada, K. ; Yamazaki, D. ; Nakamura, K.

  • Author_Institution
    Graduate Sch. of Eng., Tohoku Univ., Sendai, Japan
  • Volume
    1
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    475
  • Abstract
    Ultrasound transducers will have a broadband frequency characteristic if the relevant piezoelectric parameters could be graded in the thickness direction of the plate. As is well known, piezoelectric properties will fade away gradually if the material temperature approaches to the Curie point. From this viewpoint, we present a functionally graded piezoelectric material for broadband ultrasound transducers created by giving a temperature variation across a piezoelectric ceramic plate that has a relatively low Curie temperature. The distribution of the piezoelectric constant is estimated by comparing the measured impedance characteristic with that calculated by an equivalent network model specially derived by the authors for the plates with a graded piezoelectric constant
  • Keywords
    electric impedance; functionally graded materials; permittivity; piezoceramics; piezoelectric transducers; temperature distribution; ultrasonic transducers; US transducers; antiresonant frequency; broadband frequency characteristic; capacitance; coupling coefficient; dielectric constant; elastic constant; equivalent network model; functionally graded piezoelectric material; impedance characteristic; internal temperature gradient; piezoelectric ceramic plate; piezoelectric constant; relatively low Curie temperature; resonant frequency; temperature variation; thickness-poled plate; Biomedical transducers; Dielectric measurements; Frequency; Impedance measurement; Piezoelectric materials; Piezoelectric transducers; Temperature; Ultrasonic imaging; Ultrasonic transducers; Ultrasonic variables measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 2000. ISAF 2000. Proceedings of the 2000 12th IEEE International Symposium on
  • Conference_Location
    Honolulu, HI
  • ISSN
    1099-4734
  • Print_ISBN
    0-7803-5940-2
  • Type

    conf

  • DOI
    10.1109/ISAF.2000.941600
  • Filename
    941600