Title :
Redundancy - it´s not just for defects any more
Author_Institution :
Artisan Components, Sunnyvale, CA, USA
Abstract :
This paper shows how process variation affects memory margin and performance, and shows that in some cases additional redundancy capability can be used to recover yield due to process variation in addition to yield recovery for defects.
Keywords :
integrated circuit yield; integrated memory circuits; redundancy; defects; memory margin; process variation; redundancy; yield recovery; Circuits; Clocks; Logic; Manufacturing; Measurement; Memory architecture; Process design; Signal design; Stress; Timing;
Conference_Titel :
Memory Technology, Design and Testing, 2004. Records of the 2004 International Workshop on
Print_ISBN :
0-7695-2193-2
DOI :
10.1109/MTDT.2004.1327994
