• DocumentCode
    3352832
  • Title

    Simulating AMHS performance for semiconductor wafer fabrication

  • Author

    Pierce, Ned G. ; Stafford, Richard

  • Author_Institution
    Motorola Inc., Austin, TX, USA
  • fYear
    1995
  • fDate
    17-19 Sep 1995
  • Firstpage
    165
  • Lastpage
    170
  • Abstract
    This paper presents the methods and results of modeling and simulating the performance of interbay automated material-handling systems (AMHS) for semiconductor wafer fabrication. Along with a case study of a wafer fab AMHS model, this paper includes an alternate approach to modeling interbay arrivals and delays and explores periods of peak transport demands. A From:To matrix was developed from a detailed simulation model with process flows to represent the hourly demand of bay-to-bay movements. A second From:To matrix was generated to represent the mean transport time of automated material handling. We examine the effect that these matrices have on simulation output and model performance. Three distributions, Constant, Normal, and Exponential, were used with each table. The comparison between detailed and matrix input results included the mean and 95th percentile of delivery times and lot cycle time differentials, as well as car utilization and model execution time. The Exponential distribution provided results closest to those of the detailed model
  • Keywords
    exponential distribution; integrated circuit manufacture; materials handling; normal distribution; production control; semiconductor process modelling; From:To matrix; car utilization; constant distribution; delivery times; exponential distribution; interbay arrivals; interbay automated material-handling systems; interbay delays; lot cycle time differentials; model execution time; normal distribution; peak transport demands; performance modeling; performance simulation; semiconductor wafer fabrication; Contamination; Fabrication; Materials handling; Monitoring; Performance analysis; Powders; Power system modeling; Semiconductor device manufacture; Semiconductor device modeling; Workstations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Manufacturing, 1995., IEEE/UCS/SEMI International Symposium on
  • Conference_Location
    Austin, TX
  • Print_ISBN
    0-7803-2928-7
  • Type

    conf

  • DOI
    10.1109/ISSM.1995.524382
  • Filename
    524382