DocumentCode
335361
Title
Statistical approaches to fault analysis in multivariate process control
Author
De Veaux, Richard D. ; Ungar, Lyle H. ; Vinson, Jonathon M.
Author_Institution
Princeton Univ., NJ, USA
Volume
2
fYear
1994
fDate
29 June-1 July 1994
Firstpage
1274
Abstract
After a brief review of some statistical approaches to multivariate process control, we present a technique for determining root causes when information is available on likely out of control scenarios or fault types. We utilize linear dimension reduction techniques such as principal component analysis or partial least squares to limit the number of latent variables to study. While using historical control data is important in establishing control means and limits, these data often have less structure for dimension reduction than do data which come from known fault types. If these latter data are available, the expanded data set can be analyzed for dimension reduction, using the in control data to set limits in the reduced set. When a sequence of points is then seen to be beyond the control limits, the distance to the nearest known fault type is measured. If the dimensions can be reduced to two, these can be plotted as well. The new problem is classified into one of the existing fault types when its distance to it becomes smaller than a pre-specified criterion. If it remains out of control, but fails to approach an existing fault type, a new fault paradigm is created. Our approach is demonstrated on a simulated chemical process.
Keywords
chemical industry; fault diagnosis; least squares approximations; multivariable control systems; quality control; statistical analysis; statistical process control; chemical process control; dimension reduction; fault analysis; linear dimension reduction; multivariable process control; multivariate process control; partial least squares; principal component analysis; quality control; statistical analysis; Chemical processes; Control charts; Fault diagnosis; Least squares methods; Monitoring; Principal component analysis; Process control; Quality control; Redundancy;
fLanguage
English
Publisher
ieee
Conference_Titel
American Control Conference, 1994
Print_ISBN
0-7803-1783-1
Type
conf
DOI
10.1109/ACC.1994.752264
Filename
752264
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