Title :
Investigation on pseudospark recovery voltage
Author :
Meslem, Y. ; Bauville, G. ; Bendiab, F. ; Delmas, A.
Author_Institution :
Lab. de Phys. des Gaz et des Plasmas, Univ. de Paris-Sud, Orsay, France
fDate :
June 29 1997-July 2 1997
Abstract :
Some papers note quenching phenomenon with pseudospark discharges at zero of the flow current oscillation. The question should be asked on the recovery voltage ability with these discharges. So, should they allow switch off operation and what is their efficiency ? The authors´ work gives experimental results on the recovery voltage after 86 /spl mu/s to 8 ms pulse current discharge duration in 0.05 Pa air. The current intensity investigation reaches at 30 kA. A grid over the face gap anode and air static pressure lower than 0.1 Pa give better results. Then, they obtain quenching with 24 kA current pulse (830 /spl mu/s half period) under low recovery voltage (few 100 V) better (60 %) than with no grid anode addition. The recovery voltage reaches 10 kV in 2 /spl mu/s after 10 kA, 820 /spl mu/s current pulse discharge with 66 mm electrodes diameter. Likewise, the cathode face gap appearance is significant in obtaining optimal results. With a smooth face gap cathode, the recovery voltage increases from the 200 th shot (100%). They obtain the same result with a sanded face gap cathode after only 10 shots (10 kV after 2 ms).
Keywords :
anodes; cathodes; power supplies to apparatus; pulse generators; pulsed power switches; spark gaps; switchgear testing; 0.05 Pa; 10 kV; 2 mus; 24 kA; 30 kA; 66 mm; 830 mus; 86 mus to 8 ms; air static pressure; current intensity; electrode diameter; face gap anode; face gap cathode; flow current oscillation; pseudospark recovery voltage; pulse current discharge duration; pulsed power switch; quenching phenomenon; Anodes; Cathodes; Circuits; Electrodes; Low voltage; Plasmas; Probes; Switches; Testing; Threshold voltage;
Conference_Titel :
Pulsed Power Conference, 1997. Digest of Technical Papers. 1997 11th IEEE International
Conference_Location :
Baltimore, MA, USA
Print_ISBN :
0-7803-4213-5
DOI :
10.1109/PPC.1997.674511