Analysis of mirror-tilting and sampling errors in Fourier transform spectrometry and design of error analysis Graphical User Interface

Author

Xuzhu Wang ; Xueli Cai

Author_Institution

Dept. of Electron. Eng., Ocean Univ. of China, Qingdao, China

Volume

6

fYear

2011

fDate

12-14 Aug. 2011

Firstpage

3186

Lastpage

3189

Abstract

The Michelson interferometer is the optical core of the Fourier Transform Spectrometer. In order to obtain the spectrum, one needs to sample the interferogram and then conduct Fourier transform on it. Tilting of the moving mirror during a scan will have a bad effect on the interferogram and the spectrum. If the sampling positions are not accurate, there are sampling errors that will affect the measurement of the spectrum. The causes and categories of the tilting and sampling errors are analyzed in this paper. The sinusoidal and static tilting errors and the sinusoidal and random sampling errors are taken as examples. The mathematical model is given, and the effects of the two types of errors on the interferogram and spectrum are analyzed and simulated numerically by MATLAB. By making the Graphical User Interface (GUI), it will be convenient to observe the influences of these two types of errors on the spectrum.

Keywords

Fourier transform spectrometers; Michelson interferometers; error analysis; graphical user interfaces; mirrors; physics computing; Fourier transform spectrometry; Michelson interferometer; error analysis design; graphical user interface; interferogram error; mathematical model; moving mirror-tilting analysis; optical core; random sampling error; sinusoidal sampling error; sinusoidal tilting error; spectrum error; spectrum measurement; static tilting error; Adaptive optics; Fourier transforms; Graphical user interfaces; MATLAB; Mirrors; Optical interferometry; Presses; Fourier transform spectrometer; GUI; MATLAB; numerical simulation; sampling error; tilting error;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronic and Mechanical Engineering and Information Technology (EMEIT), 2011 International Conference on

Conference_Location

Harbin, Heilongjiang, China

Print_ISBN

978-1-61284-087-1

Type

conf

DOI

10.1109/EMEIT.2011.6023051

Filename

6023051