• DocumentCode
    3354536
  • Title

    Consistency of overlapping batch variances

  • Author

    Wood, Demet Ceylan ; Schmeiser, Bruce

  • Author_Institution
    Sch. of Ind. Eng., Purdue Univ., West Lafayette, IN, USA
  • fYear
    1994
  • fDate
    11-14 Dec. 1994
  • Firstpage
    316
  • Lastpage
    319
  • Abstract
    When the simulation point estimator is the sample variance, its standard error can be estimated using batch variances, which are analogous to batch means for the standard error of the sample mean. We suggest a modification to the definition of OBV for analytical tractability and to improve its statistical properties. We discuss conjectures about when overlapping batch variances (OBV) is consistent. In particular, we argue that OBV seems likely to be consistent (almost) whenever overlapping batch means (OBM) is consistent. Both the definition modification and the consistency conjecture seem relevant to all overlapping batch statistics (OBS) estimators where the point estimator can be interpreted as the mean of a related stochastic process.
  • Keywords
    parameter estimation; simulation; stochastic processes; analytical tractability; consistency conjecture; definition modification; error; overlapping batch statistics; overlapping batch variances; sample variance; simulation point estimator; statistical properties; stochastic process; Analysis of variance; Analytical models; Autocorrelation; Error analysis; H infinity control; Industrial engineering; Performance analysis; Statistics; Stochastic processes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation Conference Proceedings, 1994. Winter
  • Print_ISBN
    0-7803-2109-X
  • Type

    conf

  • DOI
    10.1109/WSC.1994.717165
  • Filename
    717165