• DocumentCode
    3354633
  • Title

    An efficient test generation algorithm based on search state dominance

  • Author

    Fujino, T. ; Fujiwara, H.

  • Author_Institution
    Dept. of Comput. Sci., Meiji Univ., Kawasaki, Japan
  • fYear
    1992
  • fDate
    8-10 July 1992
  • Firstpage
    246
  • Lastpage
    253
  • Abstract
    J. Giraldi and M.L. Bushnell (1990) proposed a new test generation method, called the EST (equivalent state hashing) algorithm, which can reduce the search space for test generation by using binary decision diagram fragments to detect previously encountered search states. The authors extend the concept of search state equivalence to that of search state dominance, and propose a new extended method, the DST (dominant state hashing) algorithm, based on the search state dominance. The DST algorithm can prune the search space more effectively than the EST algorithm. The benefits of DST are illustrated through examples of decision trees.<>
  • Keywords
    combinatorial circuits; logic circuits; logic testing; binary decision diagram; dominant state hashing; equivalent state hashing; search state dominance; test generation algorithm; Benchmark testing; Boolean functions; Character generation; Circuit faults; Circuit testing; Combinational circuits; Data structures; Decision trees; Logic circuits; Logic testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Fault-Tolerant Computing, 1992. FTCS-22. Digest of Papers., Twenty-Second International Symposium on
  • Conference_Location
    Boston, MA, USA
  • Print_ISBN
    0-8186-2875-8
  • Type

    conf

  • DOI
    10.1109/FTCS.1992.243577
  • Filename
    243577