DocumentCode
3354633
Title
An efficient test generation algorithm based on search state dominance
Author
Fujino, T. ; Fujiwara, H.
Author_Institution
Dept. of Comput. Sci., Meiji Univ., Kawasaki, Japan
fYear
1992
fDate
8-10 July 1992
Firstpage
246
Lastpage
253
Abstract
J. Giraldi and M.L. Bushnell (1990) proposed a new test generation method, called the EST (equivalent state hashing) algorithm, which can reduce the search space for test generation by using binary decision diagram fragments to detect previously encountered search states. The authors extend the concept of search state equivalence to that of search state dominance, and propose a new extended method, the DST (dominant state hashing) algorithm, based on the search state dominance. The DST algorithm can prune the search space more effectively than the EST algorithm. The benefits of DST are illustrated through examples of decision trees.<>
Keywords
combinatorial circuits; logic circuits; logic testing; binary decision diagram; dominant state hashing; equivalent state hashing; search state dominance; test generation algorithm; Benchmark testing; Boolean functions; Character generation; Circuit faults; Circuit testing; Combinational circuits; Data structures; Decision trees; Logic circuits; Logic testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Fault-Tolerant Computing, 1992. FTCS-22. Digest of Papers., Twenty-Second International Symposium on
Conference_Location
Boston, MA, USA
Print_ISBN
0-8186-2875-8
Type
conf
DOI
10.1109/FTCS.1992.243577
Filename
243577
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