DocumentCode
335741
Title
A Hierarchical Data Structure To Support Diagnostic Testing
Author
Luisi, James A.
Author_Institution
Rockwell international
Volume
1
fYear
1988
fDate
1988
Firstpage
389
Lastpage
393
Keywords
Circuit analysis; Circuit simulation; Circuit testing; Data mining; Data structures; Integrated circuit measurements; Integrated circuit testing; Object oriented modeling; Sampling methods; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Signals, Systems and Computers, 1988. Twenty-Second Asilomar Conference on
ISSN
1058-6393
Type
conf
DOI
10.1109/ACSSC.1988.754023
Filename
754023
Link To Document