• DocumentCode
    3357682
  • Title

    Modification of materials surface using plasma enhanced ion beams

  • Author

    Bysttitskii, V. ; Garate, E. ; Lavernia, E. ; Peng, X. ; Yankelevich, Y. ; Kharlov, A. ; Grigoriev, V.

  • Author_Institution
    California Univ., Irvine, CA, USA
  • Volume
    2
  • fYear
    1997
  • fDate
    June 29 1997-July 2 1997
  • Firstpage
    1054
  • Abstract
    The paper presents experimental results on the application of microsecond plasma opening switch (MPOS) technology for materials surface modification. The ion beam parameters generated at MPOS are <250 keV energy, and current and energy densities of 150 A/cm/sup 2/ and <2.2 J/cm/sup 2/, respectively. Characterization of the treated samples showed structural changes to a depth of about /spl ap/1 micron. Measurements indicate an increase in microhardness of a factor of about 3 for carbon steel samples. Corrosion resistance increase for the treated samples of at least 3, as measured by mass loss, can be attained for aluminum alloys. Microstructural changes in the surface morphology indicate a reduction in grain size for the treated samples and the appearance of shallow craters. EDAX and Auger analysis of irradiated samples with pre-deposited thin films indicate that mixing due to ion beam irradiation occurs to a depth of up to 1 micron.
  • Keywords
    Auger effect; X-ray chemical analysis; corrosion protection; crystal microstructure; crystal morphology; grain size; ion beam applications; materials preparation; microhardness; plasma applications; plasma switches; pulsed power switches; surface treatment; 1 mum; Auger analysis; EDAX; aluminum alloys; carbon steel; corrosion resistance; current density; energy density; grain size reduction; ion beam irradiation; ion beam parameters; mass loss measurement; materials surface modification; microhardness; microsecond plasma opening switch technology; microstructural changes; plasma enhanced ion beams; pre-deposited thin films; shallow craters; structural changes; surface morphology; Electrical resistance measurement; Ion beams; Paper technology; Plasma applications; Plasma density; Plasma materials processing; Steel; Surface morphology; Surface treatment; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pulsed Power Conference, 1997. Digest of Technical Papers. 1997 11th IEEE International
  • Conference_Location
    Baltimore, MA, USA
  • Print_ISBN
    0-7803-4213-5
  • Type

    conf

  • DOI
    10.1109/PPC.1997.674535
  • Filename
    674535