DocumentCode
3358717
Title
High-flux experiments and simulations of pulse-mode 3D-position-sensitive CdZnTe pixelated detectors
Author
Rodrigues, Miesher L. ; He, Zhong
Author_Institution
Dept. of Nucl. Eng. & Radiol. Sci., Univ. of Michigan, Ann Arbor, MI, USA
fYear
2011
fDate
23-29 Oct. 2011
Firstpage
4677
Lastpage
4688
Abstract
In this work we present high-flux experiment and simulation results of 3D-position-sensitive CdZnTe pixelated detectors operated in pulse mode. Charge transport properties used in our simulations were carefully calculated through direct comparison between measured and simulated charge induced signals using two different methods: irradiating with α-particles on the lateral side surface of the detector at normal bias and irradiating with Mo-KαX-rays (Molybdenum) on the cathode surface at reverse bias. Measured and simulated spectra as a function of increasing flux showed energies shifting towards lower energy bins followed by complete absence of spectral information, which was found to be caused by positive space charge build up distorting and completely breaking down the operating field as flux increased. More importantly, we developed a complete 3D framework that can be extended to other semiconductor detector technologies to study and predict their performance under high-flux scenarios.
Keywords
II-VI semiconductors; X-ray detection; alpha-particle detection; cadmium compounds; carrier mobility; position sensitive particle detectors; semiconductor counters; 3D position sensitive CdZnTe detectors; CdZnTe; Mo K-alpha X-ray irradiation; alpha-particle irradiation; cathode surface; charge induced signals; charge transport properties; detector simulations; high flux experiments; pixelated CdZnTe detectors; pulse mode CdZnTe detectors; pulse mode operation; reverse bias; spectral information; Anodes; Cathodes; Charge carrier processes; Communities; X-rays; CZT; CdZnTe; Charge transport simulation; High-flux; Polarization; Space charge buildup;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE
Conference_Location
Valencia
ISSN
1082-3654
Print_ISBN
978-1-4673-0118-3
Type
conf
DOI
10.1109/NSSMIC.2011.6154758
Filename
6154758
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