• DocumentCode
    3358771
  • Title

    Commentary: Trends, Challenges and Opportunities in Semiconductor Memory Technology Scaling

  • Author

    Sandhu, Gurtej

  • Author_Institution
    Adv. Technol. Dev., Micron Technol., Inc., Boise, ID
  • fYear
    2008
  • fDate
    18-18 April 2008
  • Abstract
    As IC dimensions continue to shrink into the nanometer realm, conventional CMOS scaling appears to be running up against thermal and physical scaling wall. Technology innovations that can circumvent these scaling limits are required in order to achieve the performance gains needed to support the market demands. These performance requirements are driving the introduction of new materials and devices architectures in the process flow. In addition, the aspect ratio of nanostructures is increasing since the vertical dimension of the nano scale device structures in many instances, does not shrink. These high aspect ratio nanostructures pose a variety of new challenges related to patterning, deposition, and cleaning processes, and for the mechanical stability during and after fabrication. Nanotechnology is driving developments of materials with unique physical and chemical characteristics. These materials can potentially help extend the scaling of CMOS based semiconductor devices for logic and memory applications. For memory, conventional charge based concepts may be reaching fundamental limits and new concepts need to be explored.
  • Keywords
    CMOS memory circuits; nanoelectronics; CMOS scaling; nanoscale device structure; nanostructure aspect ratio; nanotechnology; semiconductor memory technology scaling; CMOS integrated circuits; CMOS technology; Cleaning; Nanostructured materials; Performance gain; Semiconductor materials; Semiconductor memory; Semiconductor nanostructures; Stability; Technological innovation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics and Electron Devices, 2008. WMED 2008. IEEE Workshop on
  • Conference_Location
    Boise, ID
  • Print_ISBN
    978-1-4244-2343-9
  • Type

    conf

  • DOI
    10.1109/WMED.2008.4510646
  • Filename
    4510646