• DocumentCode
    3358997
  • Title

    A 1.3–6 GHz triple-mode CMOS VCO using coupled inductors

  • Author

    Safarian, Zahra ; Hashemi, Hossein

  • Author_Institution
    Electr. Eng. - Electrophys., Univ. of Southern California, Los Angeles, CA
  • fYear
    2008
  • fDate
    21-24 Sept. 2008
  • Firstpage
    69
  • Lastpage
    72
  • Abstract
    An integrated VCO with an ultra-wide tuning range is designed and fabricated in a 0.13 mum CMOS technology. The triple-mode VCO uses a 6th-order resonator based on three coupled inductors with a compact common-centric layout, banks of switched varactors, and continuously-tuned varactors to cover the measured 1.28-6.06 GHz frequency range. Each mode corresponds to a resonant frequency of the 6th-order resonator. Mode selection is achieved using three independent active cores without using lossy switches in the resonator path. The VCO current consumption is automatically adjusted from 2.9 mA to 6.1 mA to achieve a low phase noise throughout the frequency range. The measured phase noises at 1 MHz offset from carrier frequencies of 1.76, 2.26, 3.3, 4.5, and 5.6 GHz are -120.89, -121.82, -118.46, -117.12, and -114.15 dBc/Hz, respectively. The chip area, including the pads, is 1 mm times 1 mm and the supply voltage is 1.5 V.
  • Keywords
    CMOS integrated circuits; UHF integrated circuits; inductors; microwave integrated circuits; phase noise; varactors; voltage-controlled oscillators; compact common-centric layout; continuously-tuned varactors; coupled inductors; frequency 1.3 GHz to 6 GHz; low phase noise throughout; resonant frequency; sixth order resonators; three coupled inductors; triple-mode CMOS VCO; ultrawide tuning range; voltage 1.5 V; CMOS technology; Frequency measurement; Inductors; Noise measurement; Phase noise; Resonant frequency; Switches; Tuning; Varactors; Voltage-controlled oscillators; CMOS; coupled inductor; phase noise; voltage controlled oscillator (VCO);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference, 2008. CICC 2008. IEEE
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4244-2018-6
  • Electronic_ISBN
    978-1-4244-2019-3
  • Type

    conf

  • DOI
    10.1109/CICC.2008.4672022
  • Filename
    4672022