Diagnosis with Limited Failure Information

Author

Yu Huang ; Wu-Tung Cheng ; Tamarapalli, Nagesh ; Rajski, Janusz ; Klingenberg, Randy ; Will Hsu ; Yuan-Shih Chen

Author_Institution

Mentor Graphics Corp., Wilsonville, OR

fYear

2006

fDate

Oct. 2006

Firstpage

1

Lastpage

10

Abstract

This paper discusses the challenges associated with diagnosing chain integrity and system logic failures in the production test environment with limited failure information. The following three methods were proposed to enhance diagnosis resolution in this scenario: (1) static pattern re-ordering (2) dynamic pattern re-ordering (3) per-pin based diagnosis. Experimental results illustrate that per-pin based failure logging and diagnosis algorithms enable scan chain diagnosis in volume production environment. Successful application of per-pin based chain diagnosis is demonstrated with an industrial case

Keywords

automatic test pattern generation; logic testing; production testing; chain integrity diagnosis; dynamic pattern reordering; failure information; per-pin diagnosis; scan chain diagnosis; static pattern reordering; system logic failures; Circuit faults; Circuit testing; Failure analysis; Graphics; Iterative algorithms; Logic testing; Production systems; Semiconductor device manufacture; System testing; Test pattern generators;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2006. ITC '06. IEEE International

Conference_Location

Santa Clara, CA

ISSN

1089-3539

Print_ISBN

1-4244-0292-1

Electronic_ISBN

1089-3539

Type

conf

DOI

10.1109/TEST.2006.297660

Filename

4079338