DocumentCode
3360417
Title
Session 15 - IC Technology - more Moore and more than Moore
Author
Loke, Alvin ; Lai, Jordan
Author_Institution
Advanced Micro Devices, USA
fYear
2008
fDate
21-24 Sept. 2008
Abstract
This session of exclusively invited papers covers a selection of key developments extending CMOS scaling as well as several non-CMOS technologies with pervasive applications. Included are an overview of lithography options beyond 45nm, high-K/metal-gate technology, high-speed BiCMOS, and opportunities orthogonal to conventional scaling.
fLanguage
English
Publisher
ieee
Conference_Titel
Custom Integrated Circuits Conference, 2008. CICC 2008. IEEE
Conference_Location
San Jose, CA
Print_ISBN
978-1-4244-2018-6
Type
conf
DOI
10.1109/CICC.2008.4672099
Filename
4672099
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