• DocumentCode
    3360425
  • Title

    An Efficient Pruning Method to Guide the Search of Precision Tests in Statistical Timing Space

  • Author

    Lee, Leonard ; Wang, Li.-C.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara
  • fYear
    2006
  • fDate
    Oct. 2006
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    As feature sizes continue to decrease, sensitivities of design to process variations have become harder to analyze. Traditional worst-case and nominal timing analyses are not sufficient to accurately characterize these sensitivities. Timing sensitivities can be classified into timing variability, a direct result of process variations, and timing uncertainty, caused by the interaction between some timing-dependent effects and timing variability. Statistical timing analysis is an emerging approach that promises to better quantify timing variability. However, there has been little work focusing on timing uncertainty. Searching for precision tests that bound this uncertainty in design and test is inherently a statistical problem. Using cross-coupling as an example, this work describes a non-statistical framework that utilizes a Boolean satisfiability solver (SAT), ordered binary decision diagrams (OBDD), and timing window based filtering to efficiently prune the search space. Experimental results are presented to explain that such a non-statistical solution is desired and can be effective for practical use
  • Keywords
    Boolean functions; binary decision diagrams; computability; logic testing; statistical testing; timing; Boolean satisfiability solver; nonstatistical framework; nonstatistical solution; ordered binary decision diagrams; pruning method; statistical timing analysis; statistical timing space; timing window based filtering; Boolean functions; Data structures; Delay effects; Filtering; Process design; Random variables; Testing; Timing; Uncertainty; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2006. ITC '06. IEEE International
  • Conference_Location
    Santa Clara, CA
  • ISSN
    1089-3539
  • Print_ISBN
    1-4244-0292-1
  • Electronic_ISBN
    1089-3539
  • Type

    conf

  • DOI
    10.1109/TEST.2006.297684
  • Filename
    4079362