Title :
DRAM-Specific Space of Memory Tests
Author :
AL-Ars, Zaid ; Hamdioui, Said ; van de Goor, A. ; Gaydadjiev, Georgi ; Vollrath, Joerg
Author_Institution :
Fac. of Electr. Eng., Math. & Comput. Sci., Delft Univ. of Technol.
Abstract :
DRAM testing has always been theoretically considered as a subset of general memory testing, despite the disagreement of this assumption with the DRAM test practice. This paper presents a recently developed space of DRAM faults that describes the unique aspects of DRAM behavior, it validates this fault space using extensive Spice simulation, and it identifies the memory tests necessary to detect these faults. Six different tests are derived and shown to correspond to highly effective DRAM tests in practice
Keywords :
DRAM chips; integrated circuit testing; logic testing; DRAM faults; Spice simulation; general memory testing; memory tests; Fault detection; Fault diagnosis; Laboratories; Logic; Mathematics; Random access memory; Read-write memory; Resource description framework; Space technology; Testing;
Conference_Titel :
Test Conference, 2006. ITC '06. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
1-4244-0292-1
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2006.297701