DocumentCode
3360957
Title
Multi Strobe Circuit for 2.133GHz Memory Test System
Author
Yamamoto, Kazuhiro ; Suda, Masakatsu ; Okayasu, Toshiyuki ; Niijima, Hirokatsu ; Tanaka, Koichi
Author_Institution
ADVANTEST Corp., Ora-gun
fYear
2006
fDate
Oct. 2006
Firstpage
1
Lastpage
9
Abstract
This paper presents solutions to reduce measurement error and test time in an AC characteristic test of a source-synchronous device. In order to realize such a solution, we developed a multi strobe circuit which detects a phase difference between output clock and output data at a test cycle in real time without strobe scanning. We implemented a digital delay locked loop for precise multi strobe circuit. We achieved less than 1/5 the measurement error and less than 1/16 the test time compared with the conventional test method
Keywords
delay lock loops; integrated circuit testing; integrated memory circuits; jitter; measurement errors; 2.133 GHz; AC characteristic test; digital delay locked loop; measurement error; memory test system; multi strobe circuit; source-synchronous device; test time; Circuit testing; Clocks; Data communication; Delay; Frequency; Heating; Jitter; Measurement errors; System testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2006. ITC '06. IEEE International
Conference_Location
Santa Clara, CA
ISSN
1089-3539
Print_ISBN
1-4244-0292-1
Electronic_ISBN
1089-3539
Type
conf
DOI
10.1109/TEST.2006.297711
Filename
4079389
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