Title :
The Design, Implementation and Analysis of Test Experiments
Author_Institution :
Imaging Solutions Div., Avago Technol., San Jose, CA
Abstract :
This paper discusses aspects which have to be considered in order to conduct a successful test experiment. Emphasis is on using data collected from testing large numbers of parts. Statistical arguments are presented relating to making meaningful conclusions, which includes the effects of sample size. Several pitfalls that can corrupt or skew data are discussed, and the importance of unambiguous presentation of data and results is stressed
Keywords :
design for testability; statistical testing; test design; test experiments analysis; test implementation; Circuit faults; Circuit simulation; Circuit testing; Costs; Customer satisfaction; Delay effects; Image analysis; Logic testing; Profitability; Virtual manufacturing;
Conference_Titel :
Test Conference, 2006. ITC '06. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
1-4244-0292-1
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2006.297735
